The effect of ice build-up on the soft X-ray response of a charge coupled device (CCD)

by KJ McCarthy, A Owens, J Spragg, IW Kirkman
Reference:
The effect of ice build-up on the soft X-ray response of a charge coupled device (CCD) (KJ McCarthy, A Owens, J Spragg, IW Kirkman), In NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, volume 416, 1998.
Bibtex Entry:
@article{ ISI:000076831700011,
Author = {McCarthy, KJ and Owens, A and Spragg, J and Kirkman, IW},
Title = {{The effect of ice build-up on the soft X-ray response of a charge
   coupled device (CCD)}},
Journal = {{NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION
   A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT}},
Year = {{1998}},
Volume = {{416}},
Number = {{2-3}},
Pages = {{293-300}},
Month = {{OCT 21}},
DOI = {{10.1016/S0168-9002(98)00635-4}},
ISSN = {{0168-9002}},
Unique-ID = {{ISI:000076831700011}},
}

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