Surface electrical degradation of helium implanted SiO2

by S. M. Gonzalez, A. Morono, E. R. Hodgson
Reference:
Surface electrical degradation of helium implanted SiO2 (S. M. Gonzalez, A. Morono, E. R. Hodgson), In JOURNAL OF NUCLEAR MATERIALS, volume 367, 2007. (12th International Conference on Fusion Reactor Materials (ICFRM-12), Santa Barbara, CA, DEC 07-12, 2005)
Bibtex Entry:
@article{ ISI:000249083500021,
Author = {Gonzalez, S. M. and Morono, A. and Hodgson, E. R.},
Title = {{Surface electrical degradation of helium implanted SiO2}},
Journal = {{JOURNAL OF NUCLEAR MATERIALS}},
Year = {{2007}},
Volume = {{367}},
Number = {{B}},
Pages = {{1014-1017}},
Month = {{AUG 1}},
Note = {{12th International Conference on Fusion Reactor Materials (ICFRM-12),
   Santa Barbara, CA, DEC 07-12, 2005}},
DOI = {{10.1016/j.jnucmat.2007.03.172}},
ISSN = {{0022-3115}},
EISSN = {{1873-4820}},
Unique-ID = {{ISI:000249083500021}},
}

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