Self-adaptive sampling rate data acquisition in JET’s correlation reflectometer

by G. de Arcas, J. M. Lopez, M. Ruiz, E. Barrera, J. Vega, A. Murari, A. Fonseca, JET-EFDA Contributors
Reference:
Self-adaptive sampling rate data acquisition in JET’s correlation reflectometer (G. de Arcas, J. M. Lopez, M. Ruiz, E. Barrera, J. Vega, A. Murari, A. Fonseca, JET-EFDA Contributors), In REVIEW OF SCIENTIFIC INSTRUMENTS, volume 79, 2008. (17th Topical Conference on High-Temperature Plasma Diagnostics, Albuquerque, NM, 2008)
Bibtex Entry:
@article{ ISI:000260573500255,
Author = {de Arcas, G. and Lopez, J. M. and Ruiz, M. and Barrera, E. and Vega, J.
   and Murari, A. and Fonseca, A. and JET-EFDA Contributors},
Title = {{Self-adaptive sampling rate data acquisition in JET's correlation
   reflectometer}},
Journal = {{REVIEW OF SCIENTIFIC INSTRUMENTS}},
Year = {{2008}},
Volume = {{79}},
Number = {{10}},
Month = {{OCT}},
Note = {{17th Topical Conference on High-Temperature Plasma Diagnostics,
   Albuquerque, NM, 2008}},
DOI = {{10.1063/1.2965011}},
Article-Number = {{10F336}},
ISSN = {{0034-6748}},
ResearcherID-Numbers = {{Ruiz, Mariano/H-3309-2011
   Barrera, Eduardo/H-4196-2011
   Lopez Navarro, Juan Manuel/M-2206-2014
   de arcas, Guillermo/M-2830-2014
   }},
ORCID-Numbers = {{Ruiz, Mariano/0000-0002-1337-0110
   Barrera, Eduardo/0000-0001-7197-8821
   Lopez Navarro, Juan Manuel/0000-0001-7847-8707
   de arcas, Guillermo/0000-0003-1699-7389
   Vega, Jesus/0000-0002-1622-3984}},
Unique-ID = {{ISI:000260573500255}},
}

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