On the role of spectral resolution in velocity shear layer measurements by Doppler reflectometry

by T. Happel, E. Blanco, T. Estrada

Reference:

On the role of spectral resolution in velocity shear layer measurements by Doppler reflectometry (T. Happel, E. Blanco, T. Estrada), In REVIEW OF SCIENTIFIC INSTRUMENTS, volume 81, 2010. (18th Topical Conference on High-Temperature Plasma Diagnostics, Wildwood, NJ, MAY 16-20, 2010)

Bibtex Entry:

@article{ ISI:000283754000121,
Author = {Happel, T. and Blanco, E. and Estrada, T.},
Title = {{On the role of spectral resolution in velocity shear layer measurements
   by Doppler reflectometry}},
Journal = {{REVIEW OF SCIENTIFIC INSTRUMENTS}},
Year = {{2010}},
Volume = {{81}},
Number = {{10}},
Month = {{OCT}},
Note = {{18th Topical Conference on High-Temperature Plasma Diagnostics,
   Wildwood, NJ, MAY 16-20, 2010}},
DOI = {{10.1063/1.3464475}},
Article-Number = {{10D901}},
ISSN = {{0034-6748}},
ResearcherID-Numbers = {{Happel, Tim/A-2307-2009
   Blanco, Emilio/F-8893-2016
   }},
ORCID-Numbers = {{Blanco, Emilio/0000-0002-1323-7547
   Estrada, Teresa/0000-0001-6205-2656}},
Unique-ID = {{ISI:000283754000121}},
}