by T. Happel, E. Blanco, T. Estrada
Reference:
On the role of spectral resolution in velocity shear layer measurements by Doppler reflectometry (T. Happel, E. Blanco, T. Estrada), In REVIEW OF SCIENTIFIC INSTRUMENTS, volume 81, 2010. (18th Topical Conference on High-Temperature Plasma Diagnostics, Wildwood, NJ, MAY 16-20, 2010)
Bibtex Entry:
@article{ ISI:000283754000121, Author = {Happel, T. and Blanco, E. and Estrada, T.}, Title = {{On the role of spectral resolution in velocity shear layer measurements by Doppler reflectometry}}, Journal = {{REVIEW OF SCIENTIFIC INSTRUMENTS}}, Year = {{2010}}, Volume = {{81}}, Number = {{10}}, Month = {{OCT}}, Note = {{18th Topical Conference on High-Temperature Plasma Diagnostics, Wildwood, NJ, MAY 16-20, 2010}}, DOI = {{10.1063/1.3464475}}, Article-Number = {{10D901}}, ISSN = {{0034-6748}}, ResearcherID-Numbers = {{Happel, Tim/A-2307-2009 Blanco, Emilio/F-8893-2016 }}, ORCID-Numbers = {{Blanco, Emilio/0000-0002-1323-7547 Estrada, Teresa/0000-0001-6205-2656}}, Unique-ID = {{ISI:000283754000121}}, }