Radiation induced electrical and microstructural degradation at high temperature for HP SiC

by T. Hernandez, E. R. Hodgson, M. Malo, A. Morono
Reference:
Radiation induced electrical and microstructural degradation at high temperature for HP SiC (T. Hernandez, E. R. Hodgson, M. Malo, A. Morono), In FUSION ENGINEERING AND DESIGN, volume 86, 2011. (26th Symposium on Fusion Technology (SOFT), Porto, PORTUGAL, SEP 27-OCT 01, 2010)
Bibtex Entry:
@article{ ISI:000297824000205,
Author = {Hernandez, T. and Hodgson, E. R. and Malo, M. and Morono, A.},
Title = {{Radiation induced electrical and microstructural degradation at high
   temperature for HP SiC}},
Journal = {{FUSION ENGINEERING AND DESIGN}},
Year = {{2011}},
Volume = {{86}},
Number = {{9-11}},
Pages = {{2442-2445}},
Month = {{OCT}},
Note = {{26th Symposium on Fusion Technology (SOFT), Porto, PORTUGAL, SEP 27-OCT
   01, 2010}},
DOI = {{10.1016/j.fusengdes.2010.12.064}},
ISSN = {{0920-3796}},
Unique-ID = {{ISI:000297824000205}},
}

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