by O. Pena-Rodriguez, J. Manzano-Santamaria, J. Olivares, A. Rivera, F. Agullo-Lopez
Reference:
Refractive index changes in amorphous SiO2 (silica) by swift ion irradiation (O. Pena-Rodriguez, J. Manzano-Santamaria, J. Olivares, A. Rivera, F. Agullo-Lopez), In NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, volume 277, 2012.
Bibtex Entry:
@article{ ISI:000303033900021, Author = {Pena-Rodriguez, O. and Manzano-Santamaria, J. and Olivares, J. and Rivera, A. and Agullo-Lopez, F.}, Title = {{Refractive index changes in amorphous SiO2 (silica) by swift ion irradiation}}, Journal = {{NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS}}, Year = {{2012}}, Volume = {{277}}, Pages = {{126-130}}, Month = {{APR 15}}, DOI = {{10.1016/j.nimb.2011.12.057}}, ISSN = {{0168-583X}}, ResearcherID-Numbers = {{Pena-Rodriguez, Ovidio/C-6640-2009 Manzano, Javier/K-8638-2014 Olivares, Jose/L-3432-2014 }}, ORCID-Numbers = {{Pena-Rodriguez, Ovidio/0000-0002-7329-0550 Manzano, Javier/0000-0003-1048-4451 Olivares, Jose/0000-0003-1775-9040 RIVERA, ANTONIO/0000-0002-8484-5099}}, Unique-ID = {{ISI:000303033900021}}, }