EXPLORING MACROSCOPIC SURFACE-STRUCTURES ON X-RAY CCDS USING SILICON ABSORPTION-EDGE QUANTUM EFFICIENCY MEASUREMENTS

by A. KEAY, A. OWENS, S. J. GURMAN, G. W. FRASER, K. J. MCCARTHY, A. WELLS
Reference:
EXPLORING MACROSCOPIC SURFACE-STRUCTURES ON X-RAY CCDS USING SILICON ABSORPTION-EDGE QUANTUM EFFICIENCY MEASUREMENTS (A. KEAY, A. OWENS, S. J. GURMAN, G. W. FRASER, K. J. MCCARTHY, A. WELLS), In NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, volume 97, 1995.
Bibtex Entry:
@article{nr944,
	Author = {KEAY, A. and OWENS, A. and GURMAN, S. J. and FRASER, G. W. and MCCARTHY, K. J. and WELLS, A.},
	CL = {CHESTER, ENGLAND},
	CT = {1st European Conference on Synchrotron Radiation in Materials Science},
	CY = {JUL 03-08, 1994},
	Date = {MAY 1995},
	Date-Added = {2013-10-12 14:28:32 +0000},
	Date-Modified = {2013-10-12 14:28:32 +0000},
	Doi = {10.1016/0168-583X(94)00393-9},
	Isi = {WOS:A1995RF15800069},
	Issn = {0168-583X},
	Journal = {NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS},
	Month = {May},
	Number = {1-4},
	Pages = {316--321},
	Publication-Type = {J},
	SP = {CEA Aktiebolag, Stringnis, Sweden; Daresbury Rutherford Appleton Lab, Daresbury, UK; EG&G Ortec, Oakridge, USA; Elsevier Sci BV, Amsterdam, the Netherlands; Engn & Phys Sci Res Council, Swindon, UK European Union, Brussels, Belgium; ICI Chem & Polym, Runcorn, UK; Pilkington Technol Management Ltd, Ormskirk, UK; Princeton Instruments, Trenton, USA; Siemens, Karlsruhe, Germany; Spectrolab Res Labs Ltd, Newbury, UK; Unilever Res, Wirral, UK; VCH Publ, Cambridge, UK},
	Times-Cited = {6},
	Title = {EXPLORING MACROSCOPIC SURFACE-STRUCTURES ON X-RAY CCDS USING SILICON ABSORPTION-EDGE QUANTUM EFFICIENCY MEASUREMENTS},
	Volume = {97},
	Year = {1995},
	Z8 = {0},
	Z9 = {6},
	ZB = {0},
	ZS = {0},
	Bdsk-Url-1 = {http://dx.doi.org/10.1016/0168-583X(94)00393-9}}