Dislocation Loop Generation Differences between Thin Films and Bulk in EFDA Pure Iron under Self-Ion Irradiation at 20 MeV

by Marcelo Roldan, Fernando Jose Sanchez, Pilar Fernandez, Christophe J. Ortiz, Adrian Gomez-Herrero, David Jimenez Rey

Reference:

Dislocation Loop Generation Differences between Thin Films and Bulk in EFDA Pure Iron under Self-Ion Irradiation at 20 MeV (Marcelo Roldan, Fernando Jose Sanchez, Pilar Fernandez, Christophe J. Ortiz, Adrian Gomez-Herrero, David Jimenez Rey), In METALS, volume 11, 2021.

Bibtex Entry:

@article{ WOS:000737188600001,
Author = {Roldan, Marcelo and Sanchez, Fernando Jose and Fernandez, Pilar and
   Ortiz, Christophe J. and Gomez-Herrero, Adrian and Rey, David Jimenez},
Title = {Dislocation Loop Generation Differences between Thin Films and Bulk in
   EFDA Pure Iron under Self-Ion Irradiation at 20 MeV},
Journal = {METALS},
Year = {2021},
Volume = {11},
Number = {12},
Month = {DEC},
DOI = {10.3390/met11122000},
Article-Number = {2000},
EISSN = {2075-4701},
ResearcherID-Numbers = {Sanchez, Fernando Jose/Y-6392-2019
   Ortiz, Christophe/H-3295-2015
   Jimenez-Rey, David/H-5557-2011
   Roldan, Marcelo/Y-6733-2018},
ORCID-Numbers = {Sanchez, Fernando Jose/0000-0002-4006-109X
   Ortiz, Christophe/0000-0002-5146-0651
   Jimenez-Rey, David/0000-0003-1559-2179
   Roldan, Marcelo/0000-0003-1695-2199},
Unique-ID = {WOS:000737188600001},
}