by Schmuck, S., Fessey, J., Gerbaud, T., Alper, B., Beurskens, M. N. A., de la Luna, E., Sirinelli, A., Zerbini, M. and JET-EFDA Contributors
Reference:
Electron cyclotron emission measurements on JET: Michelson interferometer, new absolute calibration, and determination of electron temperature (Schmuck, S., Fessey, J., Gerbaud, T., Alper, B., Beurskens, M. N. A., de la Luna, E., Sirinelli, A., Zerbini, M. and JET-EFDA Contributors), In REVIEW OF SCIENTIFIC INSTRUMENTS, volume 83, 2012.
Bibtex Entry:
@article{ ISI:000312834300057,
Author = {Schmuck, S. and Fessey, J. and Gerbaud, T. and Alper, B. and Beurskens,
M. N. A. and de la Luna, E. and Sirinelli, A. and Zerbini, M. and
JET-EFDA Contributors},
Title = {{Electron cyclotron emission measurements on JET: Michelson
interferometer, new absolute calibration, and determination of electron
temperature}},
Journal = {{REVIEW OF SCIENTIFIC INSTRUMENTS}},
Year = {{2012}},
Volume = {{83}},
Number = {{12}},
Month = {{DEC}},
DOI = {{10.1063/1.4768246}},
Article-Number = {{125101}},
ISSN = {{0034-6748}},
ORCID-Numbers = {{Schmuck, Stefan/0000-0003-4808-5165}},
Unique-ID = {{ISI:000312834300057}},
}