Density profile measurements by AM reflectometry in TJ-II

by Estrada, T., Sanchez, J., van Milligen, B., Cupido, L., Silva, A., Manso, M. E. and Zhuravlev, V.

Reference:

Density profile measurements by AM reflectometry in TJ-II (Estrada, T., Sanchez, J., van Milligen, B., Cupido, L., Silva, A., Manso, M. E. and Zhuravlev, V.), In PLASMA PHYSICS AND CONTROLLED FUSION, volume 43, 2001.

Bibtex Entry:

@article{nr769,
	Author = {Estrada, T. and Sanchez, J. and van Milligen, B. and Cupido, L. and Silva, A. and Manso, M. E. and Zhuravlev, V.},
	Date = {NOV 2001},
	Date-Added = {2013-10-12 14:28:31 +0000},
	Date-Modified = {2013-10-12 14:28:31 +0000},
	Doi = {10.1088/0741-3335/43/11/308},
	Isi = {WOS:000172457100008},
	Issn = {0741-3335},
	Journal = {PLASMA PHYSICS AND CONTROLLED FUSION},
	Month = {Nov},
	Number = {11},
	Pages = {1535--1545},
	Publication-Type = {J},
	Times-Cited = {25},
	Title = {Density profile measurements by AM reflectometry in TJ-II},
	Volume = {43},
	Year = {2001},
	Z8 = {0},
	Z9 = {25},
	ZB = {0},
	ZS = {0},
	Bdsk-Url-1 = {http://dx.doi.org/10.1088/0741-3335/43/11/308}}